Systems and methods for testing electronic devices using master-slave test architectures

ABSTRACT

A system may include a master test system and a plurality of slave test systems coupled to the master test system and/or each other. The system may include devices under test (DUTs) (also referred to herein as units under test (UUTs)) stored in test slots and coupled to the master test system or specific slave test systems over Ethernet, coaxial, or other cables. Each test slot may include a Faraday cage that shields the contents therein from electromagnetic signals outside the test slot. The master test system and/or the slave test systems may test the DUTs using specific sequences of tests according to testing protocols relevant to those DUTs. One or more test controllers, mobile devices, display devices, and/or input devices may be coupled to the test systems and be used to control specific test protocols performed by the test systems.

CROSS-REFERENCE TO RELATED APPLICATIONS

The present application is a continuation of U.S. patent applicationentitled SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES USINGMASTER-SLAVE TEST ARCHITECTURES, Ser. No. 15/348,920, filed Nov. 10,2016; which is a continuation-in-part of U.S. patent applicationentitled HARDWARE ARCHITECTURE FOR UNIVERSAL TESTING SYSTEM: CABLE MODEMTEST, Ser. No. 14/929,180, filed Oct. 30, 2015, both of which areincorporated by reference herein. The present application alsoincorporates by reference U.S. patent application entitled UNIVERSALDEVICE TESTING SYSTEM, Ser. No. 14/866,630, filed Sep. 25, 2015; U.S.patent application entitled CORE TESTING MACHINE, Ser. No. 14/866,720,filed Sep. 25, 2015; U.S. patent application entitled UNIVERSAL DEVICETESTING INTERFACE, Ser. No. 14/866,752, filed Sep. 25, 2015; U.S. patentapplication entitled SET TOP BOXES UNDER TEST, Serial No. Ser. No.14/866,780, filed Sep. 25, 2015; U.S. patent application entitledHARDWARE ARCHITECTURE FOR UNIVERSAL TESTING SYSTEM: WIRELESS ROUTERTEST, Serial No. Ser. No. 14/929,220, filed Oct. 30, 2015; U.S. patentapplication entitled CABLE MODEMS/EMTAS UNDER TEST, Serial No. Ser. No.14/948,143, filed Nov. 20, 2015; U.S. patent application entitledWIRELESS ROUTERS UNDER TEST, Serial No. Ser. No. 14/948,925, filed Nov.23, 2015; and U.S. patent application entitled TEST SEQUENCES USINGUNIVERSAL TESTING SYSTEM, Serial No. Ser. No. 14/987,538, filed Jan. 4,2016.

TECHNICAL FIELD

Embodiments disclosed herein are directed to computer test systems, andmore particularly to computer systems for managing testing of devicesunder test (DUTs) housed in a master test slot and one or more slavetest slots.

BACKGROUND

The process of testing various types of electronic devices (e.g., cablemodems, devices containing embedded Multimedia Terminal Adapters(eMTAs), mobile phones, any devices capable of wireless transmissions,etc.), is often an important part of manufacturing, quality assurance,and repair. Before many electronic devices are released to customers,for instance, manufacturers, distributors, and/or others in a supplychain may evaluate devices for irregularities and/or design defects. Asanother example, when customers return electronic devices still underwarranty, a manufacturer may test the devices to determine causes offailure or to ensure suitability of use by another customer.

Many test procedures have involved testing ports, protocols, and/orother components of electronic devices in a controlled environment whereindividual attributes of these electronic devices can be assessed. Astest procedures often require in-depth assessments and/or evaluations,it may be difficult to test several electronic devices at the same time.For electronic devices, such as cable modems, that have wirelesscomponents (antennas, power circuitry, transceivers, etc.), issues ofelectromagnetic interference (EMI) further make it further difficult.While it may be desirable to test several electronic devices at the sametime, many systems and methods have not been able to do so efficiently.

SUMMARY

In various implementations, a system for testing a plurality ofelectronic devices is provided. The system may include a master testsystem and a plurality of slave test systems coupled to the master testsystem and/or each other using Radio Frequency (RF) coaxial cablesand/or other couplers. The system may include devices under tests (DUTs)(interchangeably referred to herein as units under test (UUTs)) storedin test slots and coupled to the master test system or specific slavetest systems over Ethernet, coaxial, or other cables. Each test slot maybe surrounded by a Faraday cage that shields the contents therein fromelectromagnetic signals outside the test slot. The Faraday cage of atest slot may reduce electromagnetic interference from sources outsidethe test slot. In some implementations, the test systems (master testsystem and the slave test systems) may include test probes thatinterface with ports on the DUTs; the test systems may include testprobe containers that virtualize the test probes and/or configure thetest probes to execute portions of specific tests on DUTs. The testsystems may test the DUTs using specific sequences of tests according totesting protocols relevant to those DUTs. One or more test controllers,mobile devices, display devices, and/or input devices may be coupled tothe test systems and be used to control specific test protocolsperformed by the test systems.

In some implementations, one or more test system interface circuits maybe used to couple test systems to each other. The test system interfacecircuits may reduce the attenuation caused by hardware elements. Invarious implementations, the test system interface circuits may includeRF amplifiers that compensate for attenuation due to RF taps, RF coaxialcables, and/or other hardware elements. Further, in variousimplementations, one or more DUT interface circuits may reduceattenuation and/or other forms of degradation between test systems andDUTs. DUT interface circuits may include attenuators, splitters,filters, and/or other circuitry configured to reduce degradation betweentest systems and DUTs coupled thereto.

In various implementations, the master test system may comprise a cablemodem termination system, resource servers, provisioning/SessionInitiation Protocol (SIP) servers, call management system (CMS) servers,Data over Cable Service Interface Specification/Wide Area Network(DOCSIS/WAN) servers, a test controller servers, etc. Servers on amaster test system may facilitate tests of DUTs coupled to the mastertest system as well as DUTs coupled to slave test systems that are inturn coupled to the master test system. The slave test system maycomprise resource servers and test controller servers. In variousimplementations, the servers on a slave test system may facilitate testsof DUTs coupled to the slave test system.

In some implementations, a system may comprise a master test system afirst device interface, a first slave test system, and a second deviceinterface. The master test system may be configured to provide firsttest instructions to test a first plurality of devices under test, thefirst plurality of devices under test being housed in a first pluralityof test slots, the first plurality of test slots being configured toprotect the first plurality of devices under test from firstelectromagnetic interference associated with the first plurality ofdevices under test. The master test system may further be configured toprovide second test instructions to test a second plurality of devicesunder test, the second plurality of devices under test being housed in asecond plurality of test slots, the second plurality of test slots beingconfigured to protect the second plurality of devices under test fromsecond electromagnetic interference associated with the second pluralityof devices under test. The first device interface may be configured tocouple the master test system to the first devices under test over afirst coupling, the first device interface being configured toaccommodate first signal degradation due to the first coupling. Thefirst slave test system may be configured to provide the second testinstructions to the second plurality of devices under test. The seconddevice interface may be configured to couple the first slave test systemto the second devices under test over a second coupling, and may beconfigured to accommodate second signal degradation due to the secondcoupling.

In some implementations, the first signal degradation comprises a firstattenuation due to the first coupling, or the second signal degradationcomprises a second attenuation due to the second coupling. The firstplurality of devices under test may comprise a first plurality of cablemodems or a first plurality of Embedded Multimedia Terminal Adapters(eMTAs), or the second first plurality of devices under test comprises asecond plurality of cable modems or a second plurality of EmbeddedMultimedia Terminal Adapters (eMTAs).

In various implementations, the first device interface comprises a firstattenuator configured to accommodate a first attenuation due to thefirst coupling. The second device interface may comprise a secondattenuator configured to accommodate a second attenuation due to thesecond coupling.

The first plurality of test slots or the second plurality of test slotsmay comprise Faraday cages configured to magnetically shield itemshoused therein. The first plurality of test slots or the secondplurality of test slots may be incorporated into a test rack configuredto facilitate testing of items located thereon.

In some implementations, the master test system is configured to providethird test instructions to test a third plurality of devices under test,the third plurality of devices under test being housed in a thirdplurality of test slots, the third plurality of test slots beingconfigured to protect the third plurality of devices under test fromthird electromagnetic interference associated with the third pluralityof devices under test. The system may further comprise a second slavetest system, the second slave test system configured to provide thethird test instructions to the third plurality of devices under test;and a third device interface configured to couple the second slave testsystem to the third devices under test over a third coupling, the thirddevice interface being configured to accommodate third signaldegradation due to the third coupling.

In various implementations, the first slave test system and the secondslave test system are coupled to one another using a coaxial line and anamplifier, the amplifier being configured to accommodate signaldegradation. The master test system and the second slave test system maybe coupled to one another using a coaxial line and an amplifier, theamplifier being configured to accommodate signal degradation.

In some implementations, the system may further comprises a testcontroller coupled to the master test system, the test controller beingconfigured to provide the first test instructions and the second testinstructions to the master test system. The system may further comprisean input device coupled to the test controller, the input device beingconfigured to receive identifiers of the first plurality of devicesunder test and the second plurality of devices under test. The testcontroller and the input device may be incorporated into one or more ofa mobile phone, a tablet computing device, a laptop computer, and adesktop computer.

A method may comprise placing a first plurality of devices under test ina first plurality of test slots, the first plurality of test slots beingconfigured to protect the first plurality of devices under test fromfirst electromagnetic interference associated with the first pluralityof devices under test. A second plurality of devices under test may beplaced in a second plurality of test slots, where the second pluralityof test slots being configured to protect the second plurality ofdevices under test from second electromagnetic interference associatedwith the second plurality of devices under test. A first deviceinterface may be used to couple the first plurality of devices undertest to a master test system over a first coupling, the first deviceinterface being configured to accommodate first signal degradation dueto the first coupling. A second device interface may be used to couplethe second plurality of devices under test to a first slave test systemover a second coupling, the second device interface being configured toaccommodate second signal degradation due to the second coupling. Themaster test system may be configured to provide first test instructionsto test the first plurality of devices under test. The master testsystem may be configured to provide second test instructions to test thesecond plurality of devices under test. A first slave test system may beconfigured to provide third test instructions to test the secondplurality of devices under test.

In some implementations, the first signal degradation comprises a firstattenuation due to the first coupling, or the second signal degradationcomprises a second attenuation due to the second coupling. The firstplurality of devices under test may comprise a first plurality of cablemodems or a first plurality of Embedded Multimedia Terminal Adapters(eMTAs), or the second first plurality of devices under test comprises asecond plurality of cable modems or a second plurality of EmbeddedMultimedia Terminal Adapters (eMTAs).

The first device interface may comprise a first attenuator configured toaccommodate a first attenuation due to the first coupling. The seconddevice interface may comprise a second attenuator configured toaccommodate a second attenuation due to the second coupling.

In various implementations, the first plurality of test slots or thesecond plurality of test slots comprise Faraday cages configured tomagnetically shield items housed therein. The first plurality of testslots or the second plurality of test slots may be incorporated into atest rack configured to facilitate testing of items located thereon.

In some implementations, the method further comprises: using a thirddevice interface to couple the second slave test system to a thirdplurality of devices under test over a third coupling, the third deviceinterface being configured to accommodate third signal degradation dueto the third coupling, and the third plurality of devices under testbeing housed in a third plurality of test slots, the third plurality oftest slots being configured to protect the third plurality of devicesunder test from third electromagnetic interference associated with thethird plurality of devices under test; and providing third testinstructions to test a third plurality of devices under test.

The method may further comprise coupling the second slave test system tothe first slave test system or to the master test system.

In some implementations, the method comprises coupling a second slavetest system to the master test system; using a third device interface tocouple the second slave test system to a third plurality of devicesunder test over a third coupling, the third device interface beingconfigured to accommodate third signal degradation due to the thirdcoupling, and the third plurality of devices under test being housed ina third plurality of test slots, the third plurality of test slots beingconfigured to protect the third plurality of devices under test fromthird electromagnetic interference associated with the third pluralityof devices under test; and providing third test instructions to test athird plurality of devices under test.

The method may comprise providing, using a test controller coupled tothe master test system, the first test instructions and the second testinstructions to the master test system. ‘In some implementations, themethod may comprise receiving, using an input device coupled to the testcontroller, identifiers of the first plurality of devices under test andthe second plurality of devices under test. In various implementations,the test controller and the input device are incorporated into one ormore of a mobile phone, a tablet computing device, a laptop computer,and a desktop computer.

A method may comprise gathering first identifiers of a first pluralityof devices under test coupled to a master test system. Secondidentifiers of a second plurality of devices under test coupled to afirst slave test system coupled to the master test system may begathered.

Shared test protocols may be identified, where the shared test protocolsproviding a basis to test compliance of one or more shared functionalparameters shared by the first plurality of devices under test and thesecond plurality of devices under test. First resource test protocolsmay be identified, where the first resource test protocols providing abasis to test compliance of one or more resource parameters of the firstplurality of devices under test. Second resource test protocols may beidentified, where the second resource test protocols providing a basisto test compliance of one or more resource parameters of the secondplurality of devices under test. A group of shared probes at the mastertest system may be configured to implement the shared test protocols onthe first plurality of devices under test and the second plurality ofdevices under test. A first group of resource probes may be configuredat the master test system to implement the first resource test protocolson the first plurality of devices under test. Instructions to configurea second group of resource probes at the first slave test system toimplement the second resource test protocols on the second plurality ofdevices under test may be provided to the first slave test system.

In some implementations, the first plurality of devices under test arehoused in a first plurality of test slots configured to protect thefirst plurality of test devices under test from electromagneticinterference. The second plurality of devices under test may be housedin second plurality of test slots configured to protect the secondplurality of test devices under test from electromagnetic interference.

The method may comprise gathering third identifiers of a third pluralityof devices under test coupled to a second slave test system; identifyingthird resource test protocols, the third resource test protocolsproviding a basis to test compliance of one or more resource parametersof the third plurality of devices under test; configuring the group ofshared probes at the master test system to implement the shared testprotocols on the third plurality of devices under test; and providing tothe second slave test system instructions to configure a third group ofresource probes at the second slave test system to implement the thirdresource test protocols on the third plurality of devices under test.

In various implementations, the second slave test system is coupled toone or more of the master test system and the first slave test system.

The devices under test may comprise one or more of cable modems andembedded multimedia terminal adapters (eMTAs).

In some implementations, configuring the group of shared probescomprises identifying one or more test probe containers corresponding tothe group of shared probes, the one or more test probe containerscomprising virtual representations of the group of shared probes.Configuring the first group of resource probes may comprise identifyingone or more test probe containers corresponding to the first group ofresource probes, the one or more test probe containers comprisingvirtual representations of the first group of resource probes.

Configuring the second group of resource probes may comprise identifyingone or more test probe containers corresponding to the second group ofresource probes, the one or more test probe containers comprisingvirtual representations of the second group of resource probes.

The shared test protocols may comprise test protocols for testing: cablemodem termination system (CMTS) responses, provisioning/SessionInitiation Protocol (SIP) responses, call management system (CMS)responses, and Data over Cable Service Interface Specification/Wide AreaNetwork (DOCSIS/WAN) responses.

The method may be executed by the master test system.

A system may comprise a master test management server configured togather first identifiers of a first plurality of devices under testcoupled to a master test system, and to gather second identifiers of asecond plurality of devices under test coupled to a first slave testsystem coupled to the master test system; a shared test protocol serverconfigured to identify shared test protocols, the shared test protocolsproviding a basis to test compliance of one or more shared functionalparameters shared by the first plurality of devices under test and thesecond plurality of devices under test; a resource identification serverconfigured to identify first resource test protocols, the first resourcetest protocols providing a basis to test compliance of one or moreresource parameters of the first plurality of devices under test, and toidentify second resource test protocols, the second resource testprotocols providing a basis to test compliance of one or more resourceparameters of the second plurality of devices under test; a master probecontainer configured to configure a group of shared probes at the mastertest system to implement the shared test protocols on the firstplurality of devices under test and the second plurality of devicesunder test, and to configure a first group of resource probes at themaster test system to implement the first resource test protocols on thefirst plurality of devices under test; and a slave test system controlserver configured to provide to the first slave test system instructionsa second group of resource probes at the first slave test system toimplement the second resource test protocols on the second plurality ofdevices under test.

In various implementations, the first plurality of devices under testare housed in a first plurality of test slots configured to protect thefirst plurality of test devices under test from electromagneticinterference. The second plurality of devices under test may be housedin second plurality of test slots configured to protect the secondplurality of test devices under test from electromagnetic interference.The second plurality of devices under test may be housed in secondplurality of test slots configured to protect the second plurality oftest devices under test from electromagnetic interference.

In some implementations, the master test management server is configuredto gather third identifiers of a third plurality of devices under testcoupled to a second slave test system; the resource identificationserver is configured to identify third resource test protocols, thethird resource test protocols providing a basis to test compliance ofone or more resource parameters of the third plurality of devices undertest; and the slave test system control server is configured to provideto the second slave test system instructions to configure a third groupof resource probes at the second slave test system to implement thethird resource test protocols on the third plurality of devices undertest. The second slave test system may be coupled to one or more of themaster test system and the first slave test system.

In various implementations, the devices under test comprise one or moreof cable modems and embedded multimedia terminal adapters (eMTAs). Themaster probe container may be configured to identify one or more testprobe containers corresponding to the group of shared probes, the one ormore test probe containers comprising virtual representations of thegroup of shared probes.

The resource identification server may be configured to identify one ormore test probe containers corresponding to the first group of resourceprobes, the one or more test probe containers comprising virtualrepresentations of the first group of resource probes. The resourceidentification server may be configured to identify one or more testprobe containers corresponding to the second group of resource probes,the one or more test probe containers comprising virtual representationsof the second group of resource probes. The shared test protocols maycomprise test protocols for testing: cable modem termination system(CMTS) responses, provisioning/Session Initiation Protocol (SIP)responses, call management system (CMS) responses, and Data over CableService Interface Specification/Wide Area Network (DOCSIS/WAN)responses.

These and other technical solutions will become apparent to thoseskilled in the relevant art upon a reading of the following descriptionsand a study of the several examples of the drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates a high-level hardware architecture of a universaltesting system for cable modem tests, according to certainimplementations.

FIG. 2A and FIG. 2B are high-level schematics of a front view of a setof Faraday cages of a universal testing system, according to certainimplementations.

FIG. 3 is a high level schematic that illustrates the connectivityfeatures of backplates of physical slots to test systems, according tocertain implementations.

FIG. 4 is a high-level schematic of connectivity of a Device Under Test(DUT) with a Multimedia over Coax Alliance (MOCA) Local Area Network(LAN) harness and a MOCA Wide Area Network (WAN) harness, according tocertain implementations.

FIG. 5 is a high-level schematic that illustrates a Foreign ExchangeOffice (FXO) test hardware architecture, according to certainimplementations.

FIG. 6 is high-level schematic that illustrates a Cable ModemTermination System (CMTS) test architecture associated with the FXO testarchitecture, according to certain implementations.

FIG. 7A illustrates a high-level hardware architecture of a testingnetwork for cable modem tests using a master test system and a pluralityof slave test systems, according to some implementations.

FIG. 7B illustrates a high-level hardware architecture of a testingnetwork for cable modem tests using a master test system and a pluralityof slave test systems, according to some implementations.

FIG. 8 illustrates a hardware architecture of a plurality of tests slotsused in a test system for cable modem tests, according to someimplementations.

FIG. 9 illustrates a hardware architecture that includes a deviceinterface used to connect a test system to a DUT, according to someimplementations.

FIG. 10 illustrates a master test system, according to someimplementations.

FIG. 11 illustrates a master test system coupled to a device interfaceand a DUT, according to some implementations.

FIG. 12 illustrates a slave test system, according to someimplementations.

FIG. 13 illustrates a master test system and a slave test system coupledto a device interface and a DUT, according to some implementations

FIG. 14 illustrates a high-level hardware architecture of a testingnetwork for cable modem tests using a master test system and a pluralityof slave test systems, according to some implementations.

FIG. 15 illustrates a high-level system architecture of a testingnetwork for cable modem tests using a master test system and a pluralityof slave test systems, according to some implementations.

FIG. 16 illustrates a flowchart of a method for testing a cable modem inone or more slots using a master test system and a plurality of slavetest systems, according to some implementations.

FIG. 17 illustrates a flowchart of a method for testing a cable modem inone or more slots using a master test system and a plurality of slavetest systems, according to some implementations.

FIG. 18 illustrates a block diagram of a digital device, according tosome implementations.

DETAILED DESCRIPTION

Methods, systems, user interfaces, and other aspects of the inventionare described. Reference will be made to certain implementations of theinvention, examples of which are illustrated in the accompanyingdrawings. While the invention will be described in conjunction with theimplementations, it will be understood that the description is notintended to limit the invention to these particular implementationsalone. On the contrary, the invention covers alternatives, modificationsand equivalents that are within the spirit and scope of the invention.The specification and drawings are to be regarded in illustrative ratherthan restrictive.

In the following description, numerous specific details are set forth toprovide a thorough understanding of the present invention. However, theinvention may be practiced without these particular details. In otherinstances, methods, procedures, components, and networks that are wellknown to those of ordinary skill in the art are not described in detailto avoid obscuring aspects of the present invention.

FIG. 1 illustrates a high-level hardware architecture of a universaltesting system for cable modem tests, according to certainimplementations. FIG. 1 shows a test station 100 that includes a testcontroller 102, a plurality of test systems (servers) 104 a-104 n, aforeign exchange office (FXO) server 140, example user interfaces thatcan include a touch screen display 106, a bar codescanners/keyboard/mouse (112), and a remote tablet 108. Each of theplurality of test systems 104 a-104 n may be associated with at leastone Faraday cage. Each Faraday cage is, in turn, associated with severalphysical test slots, of which in each can be installed a device (e.g.,wireless router) to be tested. Each installed device in the variousphysical slots may be referred to as a device under test (DUT). For easeof explanation and to avoid overcrowding the drawing of FIG. 1, FIG. 1shows only one of the Faraday cages 114. Each Faraday cage 114 isassociated with a cable modem termination system (CMTS) 120, aMultimedia over Coax Alliance (MOCA) Local Area Network (LAN) harness122 and a radio frequency (RF) splitter 124. According to certainimplementations, MOCA LAN harness 122 is connected to RF splitter 124via RF cable 126 b and CMTS 120 is connected to RF splitter 124 via RFcable 126 a. RF splitter 124 is connected to Faraday cage 114 via COAXcable 126 c. Faraday cage 114 has Ethernet connections 116 to itsassociated test system. MOCA LAN harness 122 also has an Ethernetconnection 129 to the associated test system. CMTS 120 also has anEthernet connection 128 to the FXO server via local router 142. Testcontroller 102, test systems 104 a-104 n, and FXO server have a LAN 130connection to a firewall/gateway/router 110, which in turn is connectedto a Wide Area Network (WAN) 132. A user can optionally use remotewireless tablet 108 to interface with test station 100 remotely througha wireless communication 134 to firewall/gateway/router 110. Further FXOserver 140 is connected to Faraday cage 114 via telephony cable 144,according to certain implementations.

According to certain implementations, the firewall isolates the testframework of the testing system.

According to certain implementations, the CMTS is used for testing DataOver Cable Service Interface Specification (DOCSIS) device registrationand data throughput.

According to certain implementations, the testing system comprises atleast one test station 100. According to certain implementations, eachtest station 100 includes a plurality of Faraday cages wherein eachFaraday cage includes a plurality of physical slots for testing devices.As a non-limiting example, a subset of the plurality of physical slotsis associated with a corresponding test system. As a non-limitingexample, a test station may have four test systems, each of which isassociated with a Faraday cage, which in turn is associated with a setof four physical slots of the plurality of physical slots. Theimplementations are not restricted to four test systems. Further,implementations are not restricted to one Faraday cage per test system,nor are the implementations restricted to four physical slots perFaraday cage. The number of test systems, Faraday cages, and physicalslots may vary from implementation to implementation. According tocertain implementations, each test system includes virtualizationcontainers that act as probes for testing devices installed in thephysical slots in the test station.

According to certain implementations, several wireless devices can betested simultaneously in the test station.

According to certain implementations, the user interface can communicatethrough web sockets with the test system. Such communication is inreal-time, bi-directional and asynchronous so that the user can controland monitor the testing of multiple devices simultaneously andindependently of each other using the same universal testing system.

According to certain implementations, the testing system is capable oftesting a set of similar types of devices or a set of disparate devices.

According to certain implementations, test controller 102 is a computersubsystem that manages the user interfaces of the testing system. Thus,at least the following devices are connected to test controller 102:touch screen display 106, and bar code scanners/keyboard/mouse 112.

According to certain implementations, touch screen display 106 is atouch-enabled screen that senses user/operator inputs for a given DUT.For example, each DUT is represented on the touch screen display as awindow that includes test related information such as test progress andtest results. As another non-limiting example, a user/operator can usetouch screen display 106 to input Light Emitting Diode (LED) status (isthe LED lit or not lit) when the user/operator is prompted for inputs aspart of the testing procedure of a given DUT.

According to certain implementations, one or more the bar code scanners112 can be used to read DUT information such as serial number of theDUT, and default Wi-Fi passwords associated with the given DUT. Suchinformation is needed to conduct testing on the given DUT.

According to certain implementations, test controller 102 includes anEthernet interface to connect to the plurality of test systems 104 a-104n. Test controller 102 communicates with the plurality of test systems104 a-104 n using such an Ethernet interface to conduct tests on thevarious DUTs that are installed in test station 100.

According to certain implementations, keyboard/mouse 112 are part oftest controller 102 and can be used by the user/operator to input dataneeded to run the tests on the various DUTs installed in test station100.

According to certain implementations, each test system of the pluralityof test systems 104 a-104 n provides interfaces (hardware ports) neededto conduct one or more tests on the DUTs. Depending on the type of test,a given test may need a single port or multiple ports as part of thetest infrastructure. According to certain implementations, such portsare controlled by virtualization containers at the test systems.

According to certain implementations, a given test system includes thefollowing devices: PCI/PCI Express/Mini PCI Express slots, Ethernetconnectivity hardware and software.

According to certain implementations, the PCI/PCI Express/Mini PCIExpress slots allow Wi-Fi cards to be installed on a given test systemto provide Wi-Fi connectivity to perform Wi-Fi tests on the DUTs. Suchslots can also be used to install Ethernet cards to provide Ethernetports to perform tests on the DUTs. According to certainimplementations, such PCI/PCI Express/Mini PCI Express slots can host aset of ports that can be associated with a corresponding set ofvirtualization containers on the test systems. Such virtualizationcontainers are used for testing various features on the DUTs such asWi-Fi, LAN, WAN, or MOCA interfaces of a given DUT.

According to certain implementations, the voice port associated with theFXO card is used for testing Voice over IP (VoIP) connection andfunctions.

According to certain implementations, Ethernet connectivity hardware andsoftware are provided to connect the test controller computer to theplurality of test systems for controlling the plurality of test systems.

According to certain implementations, the test systems run test scriptsto perform one or more tests such as: 1) testing Ethernet datathroughput speeds, 2) testing Wi-Fi throughput speeds, 3) testing MOCAthroughput speeds, 4) testing VOIP connections and functions, 5) testingMultiple-Input, Multiple-Output (MIMO) antenna technology, according tocertain implementations. According to certain implementations, the testsystems use virtualization containers to run such tests.

FIG. 2A and FIG. 2B are high-level schematics of front views of a set ofFaraday cages of a universal testing system, according to certainimplementations. FIG. 2A shows two Faraday cages (202, 204) of theplurality of Faraday cages of the universal testing system according tocertain implementations. Faraday cage 202 comprises a number of physicalslots, such as slots 202 a, 202 b, 202 c, 202 d. Each slot of Faradaycage 202 has a backplate (202 ab, 202 bb, 202 cd, 202 db). Faraday cage204 comprises a number of physical slots, such as slots 204 a, 204 b,204 c, 204 d. Each slot of Faraday cage 204 has a backplate (204 ab, 204bb, 204 cd, 204 db). Backplates are also known as backplanes.

Similarly, FIG. 2B shows two Faraday cages (206, 208) of the pluralityof Faraday cages of the universal testing system, according to certainimplementations. Faraday cage 206 comprises a number of physical slots,such as slots 206 a, 206 b, 206 c, 206 d. Each slot of Faraday cage 206has a backplate (206 ab, 206 bb, 206 cd, 206 db). Faraday cage 208comprises a number of physical slots, such as slots 208 a, 208 b, 208 c,208 d. Each slot of Faraday cage 204 has a backplate (208 ab, 208 bb,208 cd, 208 db). Sample backplates are described herein with referenceto FIG. 3 herein.

FIG. 3 is a high-level schematic that illustrates the connectivityfeatures of backplates of physical slots relative to test systems,according to certain implementations. For ease of explanation, FIG. 3shows the connectivity of one backplate of the plurality of backplatesto one test system of the plurality of test systems in the universaltesting system, according to certain implementations. As previouslydescribed, there are a plurality of test systems and a plurality ofslots (and corresponding backplates) per test system, according tocertain implementations.

FIG. 3 shows a backplate 302 associated with a given slot that is, inturn, associated with a test system 304 in the universal testing system.Backplate 302 includes but is not limited to a power supply port 306, aset of ports 308, a subset of which are Ethernet ports 308 a, a set ofcoaxial ports 310, a set of voice ports 312, and a set of Wi-Fi ports(314, 316). Server 304 includes but is not limited to a master Internetport 330, a set of Ethernet card ports 332 a-g, of which 4 ports (332a-d) are Ethernet LAN ports, one Ethernet MOCA LAN port 332 e, oneEthernet MOCA WAN port 332 f, and one DUT WAN port 332 g. Test system304 also includes a set of Wi-Fi card ports 340 a-d. One or more of theWi-Fi card ports 340 a-d can be associated with a Wi-Fi virtualizationcontainer on test system 304 for use in Wi-Fi tests of the DUT,according to certain implementations.

According to certain implementations, port P3 of Ethernet ports 308 a isassociated with port P1 of Ethernet card ports 332 a. Similarly, port P4of Ethernet ports 308 a is associated with port P2 of Ethernet cardports 332 a. Port P5 of Ethernet ports 308 a is associated with port P3of Ethernet card ports 332 a. Port P6 of Ethernet ports 308 a isassociated with port P4 of Ethernet card ports 332 a.

According to certain implementations, Wi-Fi port 314 is associated withan antenna 314 a and is also associated with port P2 of Wi-Fi card port340 d via Wi-Fi cable 314 b, for example. Wi-Fi port 316 is associatedwith an antenna 316 a and is also associated with port P1 of Wi-Fi cardport 340 d via Wi-Fi cable 316 b.

According to certain implementations, a given DUT that is installed in agiven slot is connected via coaxial ports 310 to the MOCA WAN Ethernetport (332 f) and MOCA LAN Ethernet port (332 e) via a corresponding MOCAWAN harness and a MOCA LAN harness, described in greater detail below.

FIG. 4 is a high-level schematic of connectivity of a given DUT(installed in a given slot) to a MOCA LAN harness and a MOCA WANharness, according to certain implementations. MOCA WAN harness 120 andMOCA LAN harness 122 are used for testing the MOCA WAN interface and theMOCA LAN interface, respectively, of DUT 402. MOCA WAN harness 120 andMOCA LAN harness 122 are connected to a power splitter 124 via RF cable126 a and RF cable 126 b, respectively, according to certainimplementations. Power splitter 124 connects the MOCA LAN and MOCA WANto DUT 402 via RF cable 126 c. According to certain implementations,MOCA WAN harness 120 is also connected via Ethernet cable 128 to anEthernet port 412 of a test system, where such an Ethernet port 412 isassociated with a virtualization container on the test system.Similarly, MOCA LAN harness 122 is also connected via Ethernet cable 129to an Ethernet port 408 of a test system, where such an Ethernet port408 is associated with a virtualization container on the test system,according to certain implementations. Further, DUT 402 is also connectedto the test system via RF cable 418 to an Ethernet port 410 of theserver that is associated with a virtualization container.

For example, test information (and/or other related information) canflow from Ethernet port 410 (and associated virtualization container) toDUT 402 and then to the MOCA LAN interface of MOCA LAN harness 122 andthen to Ethernet port 408 (and associated virtualization container).Test information (and/or other related information) can also flow fromEthernet port 408 (and associated virtualization container) to the MOCALAN interface of MOCA LAN harness 122, and then to DUT 402, and then toEthernet port 410 (and associated virtualization container).

Similarly, test information (and other related information) can flowfrom Ethernet port 410 (and associated virtualization container) to DUT402 and then to the MOCA WAN interface of MOCA WAN harness 120 and thento Ethernet port 412 (and associated virtualization container). Testinformation (and/or other related information) can also flow fromEthernet port 412 (and associated virtualization container) to the MOCAWAN interface of MOCA WAN harness 120, and then to DUT 402, and then toEthernet port 410 (and associated virtualization container).

FIG. 5 is a high-level schematic that illustrates an FXO testarchitecture, according to certain implementations. FIG. 5 shows a DUT502, a phone port 504 of DUT 502, a phone port 506 at a given testsystem. An FXO card is installed at the given test system. The FXO cardprovides the phone port 506 that can be connected to phone port 504 ofDUT 502. Further, phone port 506 is also associated with avirtualization container 508, according to certain implementations. Sucha virtualization container can make phone calls to the DUT 502.According to certain implementations, DUT 502 may be placed inside aFaraday cage of the testing system.

FIG. 6 is high-level schematic that illustrates a CMTS test harnessassociated with the FXO test architecture, according to certainimplementations. FIG. 6 shows DUT 602, power splitter 604, MOCA RFfilter 606, RF tap 608, combiner 610, MOCA LAN harness 612, CMTS 614,virtualization container associated with Ethernet port 616 andvirtualization container associated with Ethernet port 618. CMTS 614 isconnected to combiner 610 via RF cable (636, 634). Combiner 610 isconnected to RF tap 608 via RF cable 632. RF tap 608 is connected toMOCA RF filter 606 via RF cable 630. MOCA RF filter 606 is connected topower splitter 604 via RF cable 628. Ethernet port 616 on a given testsystem is connected to MOCA LAN harness 612 via Ethernet cable 622. MOCALAN harness 612 is connected to power splitter 604 via RF cable 626.Power splitter 604 is connected to DUT 602 via RF cable 624. DUT 602 isconnected to Ethernet port 618 on the test system via Ethernet cable620.

According to certain implementations, the CMTS test harness enables theDUT 602 to respond to test phone calls from the MOCA interface and whichtest phone calls terminate at the phone port of DUT 602. According tocertain implementations, when the DUT 602 is powered up, the CMTS 614 isconfigured to provide IP addresses for the session initiation protocol(SIP) server running on the DUT 602.

As a non-limiting example, a telephone call path flows from Ethernetport 616 on the test system to MOCA LAN harness 612 via Ethernet cable622 and then to power splitter 604 via RF cable 626, and then to DUT 602via RF cable 624, and then to Ethernet port 618 on the test system viaEthernet cable 620.

FIG. 7A illustrates a high-level hardware architecture of a testingnetwork 700A for cable modem tests using a master test system 752 and aplurality of slave test systems 754 (1-N), according to someimplementations. Although the testing network 700A is being describedfor testing cable modems, the testing network 700A can be used to testother electronic devices, such as wireless routers, bridges, etc. Thetesting network 700A includes a firewall/gateway/router 710, coupled toa WAN 732, coupled via a wired/wireless connection to a mobile device708, and coupled to a testing system 780. The testing system 780includes a test controller 702, a MoCA LAN harness(es) 704, an FXOserver 714, and a master test system 752, each coupled via a LAN 730 tothe firewall/gateway/router 710. The testing system 780 further includesa display device 706 and an input device 712, each coupled to the testcontroller 702. The testing system 780 further includes test systems,including the master test system 752, slave test systems 754 (shown asfirst slave test systems 754(1) through Nth slave test systems 754(N)).The testing system 780 further includes test slots, including mastertest slots 756 and slave test slots 758 (shown as first slave test slots758(1) through Nth slave test slots 758(N)), each slot configured toreceive a DUT.

The testing network 700A further includes one or more communicationchannels to couple components to one another, including but not limitedto: a LAN 730, a WAN 732, a wireless link 734, coaxial cables 760,Ethernet/telephony cables 766, and/or coaxial cables 768. In variousimplementations, the LAN 730 couple the firewall/gateway/router 710, thetest controller 702, the FXO server 714, and the MoCA LAN harness 704 toone another and/or to other components not shown. The WAN 732 couplesthe firewall/gateway/router 710 to one or more components that providedata to the firewall/gateway/router 710. The wired/wireless link 734couples the mobile device 708 to the firewall/gateway/router 710. TheEthernet/telephony cables 766 couple the FXO server 714 to the mastertest slots 756 and the slave test slots 758. The coaxial cables 768couple the MoCA LAN harness 704 to the master test slots 756 and theslave test slots 758.

The testing network 700A may include one or more interfaces that couplethe test systems 752, 754 to DUTs in test slots 756, 758, and/or coupletest systems 752, 754 to other test systems 752, 754. In someimplementations, the testing network 700A may include a master-to-deviceinterface 770 configured to couple the master test system 752 to DUTs inthe master test slots 756. The master-to-device interface 770 mayinclude one or more circuits configured to accommodate attenuation ofsignals between the master test system 752 and DUTs in the master testslots 756. In some implementations, the testing network 700A may includea slave-to-device interface 772 configured to couple the slave testsystems 754 to DUTs in the slave test slots 758. The slave-to-deviceinterface 772 may be configured to accommodate attenuation of signalsbetween the slave test systems 754 and DUTs in the slave test slots 758.FIG. 9 illustrates a hardware architecture 900 that includes a deviceinterface 904 that can be used as the basis of the master-to-deviceinterface 770 and/or the slave-to-device interface 772.

The test controller 702 may include a digital device configured to allowusers to implement and/or otherwise control test processes executed bythe master test system 752 and/or the slave test systems 754 on DUTs inthe master test slots 756 and/or in the slave test slots 758. A “digitaldevice,” as used herein, may refer to any electronic device having amemory and a processor. An example of a digital device is shown in FIG.18. In various implementations, the test controller 702 may processinstructions to test DUTs in the master test slots 756 and the slavetest slots 758. More particularly, the test controller 702 may receivefrom the input device 712 and/or a touchscreen display on the displaydevice 706 identifiers and/or properties of DUTs housed in test slots.For example, the test controller 702 may receive from the input device712 names, bar codes, stock keeping unit (SKU) numbers, or otheridentifiers that identify specific models, makes, etc. of DUTs that aresubject to test protocols. In some embodiments, the test controller 702may receive information related to specific components (ports, circuits,etc.) of DUTs that are to be tested, and/or identifiers of specific testprotocols/sequences of tests that are to be performed on DUTs in themaster test slots 756 and/or the slave test slots 758. The testcontroller 702 may control the display device 706 to displayidentifiers, properties, and/or other information of DUTs. The testcontroller 702 may control the display device 706 to display results oftests performed on DUTs in the master test slots 756 and/or the slavetest slots 758. The test controller 702 may be configured similarly tothe test controller 102, shown in FIG. 1 and discussed further herein.

The test controller 702 may control the display device 706 to displaytest data to a user. “Test data,” as used herein, may refer to anyinformation relevant to testing DUTs in the master test slots 756 and/orthe slave test slots 758. The display device 706 may comprise atouchscreen display, and thus may incorporate an input device 712therein. The touchscreen display may facilitate display user interfaceelements (menus, radio buttons, etc.) that a tester can use to selectspecific DUTs and/or specific sequences of tests on DUTs. In variousimplementations, the display device 706 may be configured similarly tothe touchscreen display 106, shown in FIG. 1 and/or other figures anddiscussed further herein. It is noted that in various implementations,the display device 706 may include only some of the components of thetouchscreen display 106.

The input device 712 may comprise a digital device configured to receiveand process user input. The input device 712 may include scanners,keyboards, mice, touch screens, trackpads, and/or other input devices.The input device 712 may include one or more bar code scannersconfigured to process bar codes or other encoded data. In variousimplementations, the input device 712 may be configured similarly to thebar code scanners/keyboard/mouse 112, shown in FIG. 1 and/or otherfigures and discussed further herein.

The mobile device 708 may comprise a digital device having some or allof the functionalities of the test controller 702, the display device706, and the input device 712. The mobile device 708 may comprise one ormore of a mobile phone, a tablet computing device, a laptop computer,and a desktop computer. The mobile device 708 may be coupled to thefirewall/gateway/router 710 over the wireless link 734. In variousimplementations, the mobile device 708 may be configured similarly tothe tablet 108.

The FXO server 714 may comprise a digital device configured to providevoice over internet protocol (VOIP) and/or other telephony services toother devices. In various implementations, the FXO server 714 mayprovide voice data over the Ethernet/telephony cable(s) 766 to test DUTsin the master test slot 756 and/or the slave test slots 758. The FXOserver 714 may be configured similarly to the FXO server 140, shown inFIG. 1 and/or other figures and discussed further herein.

The MoCA LAN harness(es) 704 may comprise one or more digital devicesconfigured to receive and/or provide data over the Ethernet/telephonycable(s) 766 and/or the coaxial cable(s) 768 to test DUTs in the mastertest slot 756 and/or the slave test slots 758. The MoCA LAN harness(es)704 may include some or all of the components of the MOCA LAN harness122, shown in FIG. 1 and/or other figures and discussed further herein.The MoCA LAN harness(es) 704 may include other components.

The master test system 752 may comprise a digital device configured tosupport tests of DUTs in the master test slots 756 and/or the slave testslots 758. The master test system 752 may receive from the testcontroller 702 identifiers of specific DUTs in the master test slots 756and/or the slave test slots 758. In some implementations, theidentifiers may correspond to bar codes, model numbers, serial numbers,or other identifiers of DUTs scanned in/obtained/etc. by the inputdevice 712. The master test system 752 may further receive identifiersof specific tests (e.g., specific components to test, specific testprotocols, etc.) to be performed on DUTs in the master test slots 756and/or the slave test slots 758.

In some implementations, the master test system 752 implements one ormore control servers that control tests of DUTs in the master test slots756 and/or the slave test slots 758. Some control servers in the mastertest system 752 may facilitate tests of DUTs in the master test slots756, while other control servers in the master test system 752 mayfacilitate tests of DUTs in the slave test slots 758. As examples, thecontrol servers in the master test system 752 may include controlservers for: testing provisioning/SIP features of DUTs in the mastertest slots 756 and DUTs in the slave test slots 758, for providingresources for testing DUTs in the master test slots 756 and DUTs in theslave test slots 758, for testing call management service features ofDUTs in the master test slots 756 and DUTs in the slave test slots 758,and/or for testing DOCSIS/WAN features of DUTs in the master test slots756 and DUTs in the slave test slots 758. The control servers in themaster test system 752 may further include functionalities of a cablemodem termination system (e.g., features of the CMTS 120 shown inFIG. 1) for testing those features of DUTs in the master test slots 756and DUTs in the slave test slots 758.

In some implementations, the control servers in the master test system752 may manage probes used to test ports and/or other components of DUTsin the master test slots 756. A “probe,” as used herein, may refer tohardware, firmware, software, or some combination thereof that is usedto virtualize an interface with a port or other component of a DUT.Probes may, but need not, include software servers that representphysical properties (voltages, currents, etc.) of an interface with aport or other component of a DUT.

The control servers in the master test system 752 may allow the mastertest system 752 to provide to the slave test systems 754 instructions toperform tests on DUTs in the slave test slots 758. The control serversin the master test system 752 may allow the master test system 752 toprovide instructions to control the slave test systems 754. FIG. 10 andFIG. 11 show examples of the master test system 752 in greater detail.

The slave test systems 754 may comprise a digital device configured tosupport tests of DUTs in the slave test slots 758. The slave testsystems 754 may receive from the test controller 702 identifiers ofspecific DUTs in the slave test slots 758. The identifiers maycorrespond to codes, model numbers, serial numbers or other identifiersof DUTs scanned in/obtained/etc. by the input device 712. The slaveserver 754 may further receive identifiers of specific tests (e.g.,specific components to test, specific test protocols, etc.) to beperformed on DUTs in the slave test slots 758.

The slave test systems 754 may implement one or more control serversthat control tests of DUTS in the slave test slots 758. Examples ofcontrol servers in the slave test systems 754 include: control serversfor processing instructions from the master test system 752, controlservers for providing resources for testing DUTs in slave test slots758, and control servers for managing probe containers used to testports and/or other components of DUTs in the slave test slots 758. Invarious implementations, the slave test systems 754 receives from themaster test system 752 instructions to perform the following tests onDUTs in the slave test slots 758: provisioning/SIP tests, CMS tests,DOCSIS/WAN tests, and/or tests using a cable modem termination system(CMTS) incorporated in the master test system 752.

In various implementations, the slave test systems 754 are coupled tothe master test system 752 and/or each other over the coaxial cable(s)760. Amplifier(s) 774 may be placed between the master test system 752and the slave test systems 754, and/or between different slave testsystems 754 to address attenuation caused by the coaxial connectionsand/or components between those systems.

It will be appreciated that the master test system 752, themaster-to-device interface 770, and the master test slots 756 may bemounted onto a single rack. Similarly, each slave test system 754,slave-to-device interface 772, and slave test slots 758 may be mountedon a single rack. As will be discussed in detail below, the master testsystem 752 may include components (e.g., hardware, software and/orfirmware) for controlling the slave test systems and/or for controllingthe DUTs in the slave test slots 758, so that each slave test system 754need not have a copy of those shareable components. The shareablecomponents to be managed by the master test system 752 may be thosecomponents capable of supporting the work needed to test the DUTs of themaster test system 752 and the slave test system 754. That is, if ashareable component can support four slaves, then the shareablecomponent may be omitted from the next four slave test system 754.Similarly, if a master component cannot support any DUTs other thanthose in the master test slots 756, then a separate copy of thecomponent may need to be included in each slave test system 754.

As noted above, to address power losses, an amplifier 774 may need to beincluded between each rack or between each set of n racks (e.g., 4 or5). The number of racks between each amplifier 774 may be based on theamount of signal degradation and the size of the amplifier. The numberof racks between each amplifier 774 need not be a constant. The size ofan amplifier 774 may be based on signal strength, signal degradationacross one or more racks that precede it, the number and size ofamplifiers 774 that precede it, and/or the power needed at the DUTs.

The master test slots 756 may comprise a set of electromagneticallyshielded slots configured to house a first group of DUTs. In someimplementations, the master test slots 756 include openings for wiresand/or other computer readable media used to couple the master testsystem 752, the FXO server 714, and the MoCA LAN harness(es) 704 to thefirst group of DUTs. The master test slots 756 may comprise Faradaycages that electromagnetically shield the first group of DUTs from eachother. The master test slots 756 may include any number of test slots,e.g., 8 or 16. In some implementations, the master test slots 756 may beconfigured similarly to the Faraday cages shown in FIG. 2A and FIG. 2B,and discussed further herein. The master test slots 756 may beconfigured similarly to the test slots 800 shown in FIG. 8.

The slave test slots 758 may comprise a set of electromagneticallyshielded slots configured to house second group(s) of DUTs. In someimplementations, the slave test slots 758 include openings for wiresand/or other computer readable media used to couple the master testsystem 752, the FXO server 714, and the MoCA LAN harness(es) 704 to thesecond group(s) of DUTs. The slave test slots 758 may comprise Faradaycages that electromagnetically shield the second group(s) of DUTs fromeach other. The slave test slots 758 may include any number of testslots, e.g., 8 or 16. In some implementations, the slave test slots 758may be configured similarly to the Faraday cages shown in FIG. 2A andFIG. 2B, and discussed further herein. The slave test slots 758 may beconfigured similarly to the test slots 800 shown in FIG. 8.

In various implementations, the testing network 700A operates tofacilitate tests of DUTs in the master test slots 756 and/or the slavetests slots 758 based on instructions from the test controller 702, themaster test system 752, and/or the slave test systems 754. As an exampleof operation, test personnel (e.g., personnel responsible for testingDUTs) may load a first group of DUTs in the master test slots 756, andsecond group(s) of DUTs in the slave test slots 758. Test personnel mayinsert DUTs into relevant Faraday cages and/or electromagneticallyshielded areas of test slots. In various implementations, test personnelprovide the test controller 702 with identifiers of the DUTs insertedinto test slots. In some embodiments, the test personnel may scan barcodes of DUTs using the input device, manually enter into the inputdevice 712 identifiers of DUTs inserted into test slots, etc. In someimplementations, the test controller 702 may provide data to the displaydevice 706 to display identifiers and/or other relevant information ofDUTs that are inserted into test slots. Test personnel may couple inputcable(s) 762, Ethernet/telephony cables 766 and/or coaxial cable(s) 768to DUTs in the master and slave test slots 756,758.

Once DUTs have been inserted into test slots 756, 758 and coupled to theFXO server 714, the MoCA LAN harness(es) 704, etc., the testing network700A may operate to allow the test personnel to initiate testing of theDUTs. In various implementations, the test controller 702 may provide tothe master test system 752 instructions to initiate testing. The mastertest system 752 may provide information relevant to provisioning/SIPtests, CMS tests, DOCSIS/WAN tests, and/or tests that originate at aCMTS to DUTs in the master test slots 756 and/or DUTs in the slave testslots 758. The master test system 752 may configure the DUTs in themaster test slots 756 and/or slave test slots 758 to provide to the FXOserver 714 telephony data over the Ethernet/telephony cable(s) 766. Themaster test system 752 may configure the DUTs in the master test slots756 and/or slave test slots 758 to provide to the MoCA LAN harness(es)704 DOCSIS/WAN, provisioning/SIP and/or other test data over the coaxialcable(s) 768. In various implementations, the master test system 752 mayconfigure the DUTs in the master test slots 756 to test resources withinthose DUTs. The slave test systems 754 may configure DUTs in the slavetest slots 758 to test resources within those DUTs. In variousimplementations, the master-to-device interface 770 may allow signals topass from the master test system 752 to the DUTs in the master testslots 756 while accommodating attenuation, e.g., due to the inputcable(s) 762. The slave-to-device interface 772 may allow signals topass from the slave test systems 754 to the DUTs in the slave test slots758 while accommodating attenuation, e.g., due to the input cable(s)764.

The elements and/or couplings shown in FIG. 7A are by way of exampleonly, and it is noted that various implementations may use couplingsthat differ, at least in part, from the couplings shown in FIG. 7A. Asan example, in some implementations, each of the master test slots 756and/or the slave test slots 758 may have a specific FXO server, MoCA LANharness etc. associated with it, and/or coupled to DUTs housed therein.In these implementations, the FXO server 714 may represent a pluralityof FXO servers, each coupled to DUTs in the master test slots 756/slavetest slots 758 by independent Ethernet/telephony cables. The MoCA LANharness(es) 704 may represent a plurality of MoCA LAN harnesses, eachcoupled to the DUTs in the master test slots 756/slave test slots 758 byindependent coaxial cables and/or Ethernet/telephony cables.

FIG. 7B illustrates a high-level hardware architecture of a testingnetwork 700B for cable modem tests using a master test system and aplurality of slave test systems, according to some implementations. Thetesting network 700B may include the test controller 702, the displaydevice 706, the mobile device 708, the firewall/gateway/router 710, theinput device 712, an Ethernet connection 716, a CMTS 720 within the testcontroller 702, a MoCA LAN unit 722, a splitter 724, an RF cable 726 a,an RF cable 726 b, a coaxial cable 726 c, a LAN 730, a WAN 732, an FXOserver 740, a local router 742, a telephony cable 744, a master testsystem 752, slave test systems 754, test slots 776 (e.g., master testslot 776(1) through slave test slot 776(N)), and DUTs 778 (e.g., DUTs778(1) through DUT 778(N)). One or more components of the testingnetwork 700B may correspond to one or more components of the testingnetwork 700A. The components referenced in FIG. 7B may be configuredsimilarly and/or may operate similarly to one or more components of FIG.1 and/or FIG. 7A.

FIG. 8 illustrates a hardware architecture of a plurality of test slots800 used in the testing network 700A, according to some implementations.The plurality of test slots 800 may correspond to at least portions ofthe master test slots 756 or the slave test slots 758, shown in FIG. 7Aand discussed further herein. The test slots 800 may include a firsttest slot 802(1) through an Mth test slot 802(M). Each of the test slots800 may enclose an electromagnetically shielded region in which DUTsreside. As a result, each of the test slots 800 may include a DUTtherein. The first test slot 802(1) may include a first DUT 804(1), forinstance, and the Mth test slot 802(M) may include an Mth DUT 804(M).The test slots 800 may be physically arranged similarly to the mastertest slots 756 or the slave test slots 758, shown in FIG. 7A.

The test slots 800 may comprise openings to receive Ethernet/telephonycables and/or coaxial cables. The first test slot 802(1), for instance,may include an opening for receiving a first input coaxial cable 806(1)that couples the first DUT 804(1) to a test system (e.g., to the mastertest system 752 or a slave test systems 754). The first test slot 802(1)may also include openings for a first output Ethernet/telephony cable808(1) that couples the first DUT 804(1) to the FXO server 714, and fora first output coaxial cable 810(1) that couples the first DUT 804(1) tothe MoCA LAN harness(es) 704. The Mth test slot 802(M) may include anopening for receiving a Mth input coaxial cable 806(M) that couples theMth DUT 804(M) to a test system (e.g., to the master test system 752 ora slave test systems 754), an opening for a Mth outputEthernet/telephony cable 808(M) that couples the Mth DUT 804(M) to theFXO server 714, and an opening for an Mth output coaxial cable 810(M)that couples the Mth DUT 804(M) to the MoCA LAN harness(es) 704.

The input Ethernet/telephony cable(s) 806 may be coupled to a deviceinterface, such as the master-to-device interface 770 and/or theslave-to-device interface 772. An example of a device interface to whichthe input Ethernet/telephony cable(s) 806 may be coupled is shown in thehardware architecture 900 in FIG. 9.

FIG. 9 illustrates a hardware architecture 900 that includes a deviceinterface 904 coupling a test system 902 to a DUT 906, according to someimplementations. The test system 902 may comprise a CMTS 908, a diplexer910, a first RF tap 912, and a second RF tap 914. The CMTS 908 mayinclude some or all of the components of the CMTS 120 shown in FIG. 1and discussed further herein. The CMTS 908 may be coupled to thediplexer 910 via an upstream path (US) and a downstream path (DS). Thesignal level along the downstream path may be characterized by a firstsignal level (e.g., 45 decibels (dB)).

The diplexer 910 comprises a circuit that couples the upstream path ofthe CMTS 908, the downstream path of the CMTS 908, and an input port ofthe first RF tap 912 to one another. In this example, the diplexer 910may exhibit a first specified signal loss (e.g., 1.3 dB), that causesthe signal out of the diplexer 910 to have a second (and reduced) signallevel (e.g., 43.7 dB). In various implementations, the diplexer 910 maybe implemented as a frequency domain multiplexer.

The first RF tap 912 comprises a circuit configured to receive data fromthe CMTS, provide a test signal via device output ports (e.g., eight) torespective device interfaces 904 (only one shown), and to pass the testsignal via a pass-through port to the second RF tap 914. In thisexample, the first RF tap 912 may exhibit a 1.7 dB loss from the inputport to the pass-through output port, which results in a signal of 42 dBbeing provided to the second RF tap 914. The first RF tap 912 mayexhibit a 23 dB loss from the input port to each device output port,which results in a signal of 20.7 dB being provided to the deviceinterface 904.

The second RF tap 914 may comprise a circuit configured similarly to thefirst RF tap 912. The second RF tap 914 may be configured to receivedata from the pass-through port of the first RF tap 912, provide a testsignal via device output ports (e.g., eight) to respective deviceinterfaces 904 (none shown), and to pass the test signal via apass-through port to another RF tap (e.g., of another rack). In thisexample, the second RF tap 914 may exhibit a 1.7 dB loss from the inputport to the pass-through output port, which results in a signal of 40.3dB being provided to the next RF tap. The second RF tap 914 may exhibita 23 dB loss from the input port to each device output port, whichresults in a signal of 19 dB being provided to the respective deviceinterfaces 904.

The device interface 904 may comprise a circuit configured to couple thetest system 902 to the DUT 906, while accommodating attenuation betweenthe test system 902 and the DUT 906. The device interface 904 mayinclude a MoCA filter 916, a first attenuator 918, an RF splitter 920, aLAN bridge 922, and a second attenuator 924. The MoCA filter 916 maycomprise a filter for MoCA signals, including the test signal from thedevice output port of the first RF tap 912. The MoCA filter 916 may becoupled between a device output port of the first RF tap 912 and thefirst attenuator 918. The first attenuator 918 may be configured toattenuate the filtered test signal output from the MoCA filter 916 tothe DUT 906 by a specified value (e.g., 10 dB). The first attenuator 918may provide the attenuated filtered test signal to an input port of theRF splitter 920. The LAN bridge 922 may be coupled to the secondattenuator 924, which may attenuate a LAN signal (e.g., a configurationtest signal) from the LAN bridge 922 by a specified value (e.g., 20 dB).The second attenuator 924 may provide the attenuated LAN signal to asecond input port of the RF splitter 920. The RF splitter 920 mayprovide with both the attenuated LAN signal and the attenuated filteredtest signal to the DUT 906. The signals through the RF splitter may befurther attenuated, e.g., by 6.5 dB to 4.2 dB.

FIG. 10 illustrates a master test system 752, according to someimplementations. The master test system 752 may include anEthernet/telephony interface 1002, a coaxial interface 1004, controlservers 1006, and a plurality of RF taps 1008 (shown in FIG. 10 as firstRF tap 1008(1) through Lth RF tap 1008(L)). The Ethernet/telephonyinterface 1002 may comprise hardware, software, and/or firmwareconfigured to couple the master test system 752 to one or moreEthernet/telephony cables (e.g., the Ethernet/telephony cable(s) 766).The coaxial interface 1004 may comprise hardware, software, and/orfirmware configured to couple the master test system 752 to one or morecoaxial cables, such as the coaxial cable(s) 760.

The control servers 1006 may comprise hardware, software, and/orfirmware configured to provide instructions to perform tests on DUTs inthe master test slots 756. The control servers 1006 may further comprisehardware, software, and/or firmware configured to provide instructionsto manage tests performed by the slave test systems 754 on DUTs in theslave test slots 758. The control servers 1006 may include shared testprotocol servers 1010, a master resource server 1012, a slave testsystem control server 1014, a master test management server 1016, and amaster probe container 1018.

The shared test protocol servers 1010 may be configured to identifyshared test protocols. Shared test protocols, as described herein, mayrefer to test protocols that test compliance of any shared functionalparameters that are shared by different DUTs, such as the DUTs in themaster test slots 756 and the DUTs in the slave test slots 758. Theshared test protocol servers 1010 may include a provisioning/SIP server1020, a CMS server 1022, a DOCSIS/WAN server 1024, and a CMTS 1025.

The provisioning/SIP server 1020 may be configured to support testprotocols that test whether or not DUTs in the master test slots 756and/or the slave test slots 758 are appropriately provisioned.Provisioning, as used herein, may include the process of configuringDUTs as well as any processes related to ensuring DUTs are configured toaccess network and/or other external resources. Provisioning may berelated to a DUT's ability to access Voice over IP (VoIP) capabilities.In some implementations, the provisioning/SIP server 1020 may supporttest protocols that test connectivity and/or other provisioning settingsof DUTs. In some implementations, the provisioning/SIP server 1020 isconfigured to test Dynamic Host Configuration Protocol (DHCP)parameters, the ability of DUTs to obtain Internet Protocol (IP)addresses, etc. The provisioning/SIP server 1020 may identify DUTs byMedia Access Card (MAC) addresses and/or other attributes. Theprovisioning/SIP server 1020 may maintain an error log of whether or notspecific DUTs could be appropriately provisioned according to testprotocols.

The CMS server 1022 may be configured to support test protocols thattest whether or not DUTs in the master test slots 756 and/or slave testslots 758 can appropriately route calls internally or to other DUTs. Invarious implementations, the CMS server 1022 tests rules, parameters,etc., governing the routing of telephone calls through the DUTs and/orthe network coupled to the DUTs. The CMS server 1022 may test how theDUTs distribute calls according to time(s), date(s), and/or location(s).The CMS server 1022 may be configured to test calling features of DUTs(e.g., call queues, Interactive Voice Response (IVR) capabilities, andRecorded announcements). The CMS server 1022 may test call loggingcapabilities of DUTs. In some implementations, the CMS server 1022 maymaintain an error log of whether or not specific DUTs were able toappropriately route calls according to test protocols.

The DOCSIS/WAN server 1024 may be configured to support test protocolsthat test whether or not DUTs in the in the master test slots 756 and/orslave test slots 758 comply with DOCSIS standards. In variousimplementations, the DOCSIS/WAN server 1024 tests rules, parameters,etc. governing the ability of DUTs to send and/or receive data inaccordance with DOCSIS standards. The DOCSIS/WAN server 1024 maymaintain an error log of whether or not specific DUTs were able tocomply with DOCSIS standards.

The CMTS 1025 may be configured to incorporate functionalities of acable modem termination system. The CMTS 1025 may provide one or morefunctionalities provided by the CMTS 120, shown in FIG. 1, and discussedfurther herein.

The master resource server 1012 may be configured to support testprotocols that test resources on DUTs in the master test slots 756. Thetest protocols implemented by the master resource server 1012 mayprovide DUTs in the master test slots 756 with resource requests (memoryresource requests, processor resource requests, audio/video resourcerequests, network resource requests, other types of hardware resourcerequests, etc.), and determine whether or not those DUTs are able tosatisfy the resource requests. In some implementations, the masterresource server 1012 may maintain an error log of whether or notspecific DUTs could satisfy resource requests according to testprotocols.

The slave test system control server 1014 may be configured to provideinstructions to control the slave test system 754 and/or DUTs in slavetest slots 758 coupled to the slave test system 754. In someimplementations, the slave test system control server 1014 provides theslave test systems 754 with identifiers of DUTs to test. The slave testsystem control server 1014 may provide the slave test systems 754 withinstructions to configure one or more resource probes at those slavetest systems. In various implementations, the slave test system controlserver 1014 may provide specific test protocols to the slave test system754 to provide to DUTs in the slave test slots 758. The slave testsystem control server 1014 may provide identifiers of specific DUTs inthe slave test slots 758 that are to be tested under various testingprotocols.

The master test management server 1016 may be configured to identifyspecific DUTs and/or tests for specific DUTs in the master test slots756 and/or the slave test slots 758. The master test management server1016 may be configured to select various tests for both DUTs in themaster test slots 756 and the slave test slots 758, includingprovisioning/SIP tests, CMS tests, DOCSIS/WAN tests, CMTS-related tests,etc. The master test management server 1016 may be configured selecttests of resources of DUTs in the master test slots 756.

The master probe container 1018 may be configured to create, manage,etc. comprise a set of probes for accessing ports of DUTs in the mastertest slots 756. The master probe container 1018 may include probes foraccessing ports associated with shared test protocols (LAN ports, Wi-Fiports, SIP ports, provisioning ports, FXS ports, MoCA ports, etc.)and/or resource test protocols. FIG. 11 shows an example of the masterprobe container 1018 in greater detail.

The RF taps 1008 may comprise RF taps configured to couple the mastertest system 752 to device interfaces 904, e.g., as shown in FIG. 9.

FIG. 11 illustrates a master test system 752 coupled to a deviceinterface 1102 and to a DUT 804, according to some implementations. Thedevice interface 1102 may include an RF splitter 1026 coupled to a LANbridge 1028. The DUT 804 may include a LAN port 1042, a Wi-Fi port 1044,an SIP port 1046, a provisioning port 1048, and an FXS port 1050.

The master test system 752 may include a master probe container 1018,which may include one or more LAN probes 1030, one or more Wi-Fi probes1032, one or more SIP probes 1034, one or more provisioning probes 1036,one or more FXS probes 1038, and/or one or more MoCA probes 1040. Insome embodiments, the LAN port 1042 may be coupled to the LAN probe1030; the Wi-Fi port 1044 may be coupled to the Wi-Fi probe 1032; theSIP port 1046 may be coupled to the SIP probe 1034; the provisioningport 1048 may be coupled to the provisioning probe 1036; the FXS port1050 may be coupled to the FXS probe 1038; and the RF splitter 1026 maybe coupled to the MoCA probe 1040. The master probe container 1018 maybe configured to virtualize and/or otherwise support probes configuredto gather data from ports of DUTs in the master test slots 756 and/orthe slave test slots 758 in accordance with test protocols.

FIG. 12 illustrates a slave test system 754, according to someimplementations. The slave test system 754 may include anEthernet/telephony interface 1202, a coaxial interface 1204, controlservers 1206, and a plurality of RF taps 1208 (shown as first RF tap1208(1) through Lth RF tap 1208(L)). The Ethernet/telephony interface1202 may comprise hardware, software, and/or firmware configured tocouple the slave test system 754 to one or more Ethernet/telephonycables (e.g., the Ethernet/telephony cables 766). The coaxial interface1204 may comprise hardware, software, and/or firmware configured tocouple the slave test system 754 to one or more coaxial cables, such asthe coaxial cable(s) 768.

The control servers 1206 may comprise hardware, software, and/orfirmware configured to provide instructions to perform tests on DUTs inthe slave test slots 758. The control servers 1206 may further comprisehardware, software, and/or firmware configured to receive instructionsfrom the master test system 752 to perform tests on the DUTs in theslave test slots 758. The control servers 1206 may include a masterserver instruction management server 1210, a slave resource server 1212,a slave probe container 1214, and a slave test management server 1216.

The master server instruction management server 1210 may be configuredto process instructions from the master test system 752 to perform testson the DUTs in the slave test slots 758. In various implementations, themaster server instruction management server 1210 receives instructionsfrom the master test system 752 regarding provisioning/SIP testprotocols, CMS test protocols, DOCSIS/WAN test protocols, and testprotocols originating from a CMTS. The master server instructionmanagement server 1210 may provide information related toprovisioning/SIP test protocols, CMS test protocols, DOCSIS/WAN testprotocols, test protocols originating from a cable modem terminationsystem, etc. to DUTs in the slave test slots 758.

The slave resource server 1212 may be configured to support testprotocols that test resources on DUTs in the slave test slots 758. Thetest protocols implemented by the slave resource server 1212 may provideDUTs in the slave test slots 758 with resource requests (memory resourcerequests, processor resource requests, audio/video resource requests,network resource requests, other types of hardware resource requests,etc.), and determine whether or not those DUTs are able to satisfy theresource requests. In some implementations, the slave server resourceserver 1212 may maintain an error log of whether or not specific DUTscould satisfy resource requests according to test protocols.

The slave probe container 1214 may comprise a set of probes foraccessing ports of DUTs in the slave test slots 758. The slave probecontainer 1214 may include probes for accessing LAN ports, Wi-Fi ports,FXS ports, MoCA ports, etc. FIG. 13 shows an example of the slave probecontainer 1214 in greater detail.

The slave test management server 1216 may be configured to identifyspecific DUTs and/or tests for specific DUTs in the slave test slots758. The slave test management server 1216 may be configured to selectvarious tests including provisioning/SIP tests, CMS tests, DOCSIS/WANtests, CMTS-related tests, tests of resources, etc.

The RF taps 1208 may comprise RF taps configured to couple the slavetest system 754 to device interfaces 904, e.g., as shown in FIG. 9.

FIG. 13 illustrates a master test system 752 and a slave test system 754coupled to a device interface 1302 and a DUT 804, according to someimplementations. The device interface 1302 includes an RF splitter 1222coupled to a LAN bridge 1224. The DUT 804 may include a LAN port 1234, aWi-Fi port 1236, an SIP port 1240, a provisioning port 1242, and an FXSport 1238.

In some embodiments, the master probe container 1018 may include probesfor the DUTs within the master test slots 756 and probes for the DUTswithin the slave test slots 758. That way, the master test system 752can gather and evaluate the test results from each of the testsperformed on the DUTs of both the master and slave racks. For example,the master test system 752 may couple the SIP probe 1034 and theprovisioning probe 1036 of the master probe container 1018 respectivelyto the SIP port 1240 and to the provisioning port 1242 of the DUT 804.In other embodiments, probes within the master probe container 1018 mayreceive test results from probes within the slave probe container 1218for evaluation by the master test system 752.

In some embodiments, the master probe container 1018 may include probesto the DUTs within the master test slots 756 alone, e.g., when the testsmust be done locally, when the demands would be too onerous, or underother circumstances. In such embodiments, the slave probe container 1218may have local probes to the DUTs within the slave test slots 758. Forexample, the slave test system 754 may include one or more LAN probes1226, one or more Wi-Fi probes 1228, one or more FXS probes 1230, andone or more MoCA probes 1232.

In some embodiments, the LAN port 1234 may be coupled to the LAN probe1226; the Wi-Fi port 1236 may be coupled to the Wi-Fi probe 1228; theFXS port 1238 may be coupled to the FXS probe 1230; the SIP port 1240may be coupled to the SIP probe 1034; the provisioning port 1242 may becoupled to the provisioning probe 1036; and the splitter 1222 may becoupled to the MoCA probe 1232. The slave probe container 1018 may beconfigured to virtualize and/or otherwise support probes configured togather data from ports of DUTs in the slave test slots 758 in accordancewith test protocols.

FIG. 14 illustrates a high-level hardware architecture of a testingnetwork 1400 for cable modem tests using a master test system 752 and aplurality of slave test systems 754, according to some implementations.The testing network 1400 may include several, e.g., nine, slave testsystems 754 (shown as a first slave test system 754(1), a fourth slavetest system 754(4), and a ninth slave test system 754(9)).

The master test system 752 may include a CMTS 1412, a diplexer 1402, afirst RF tap 1404, and a second RF tap 1406. Each slave test system 754may comprise a first RF tap 1408 and a second RF tap 1410. The diplexer1402 exhibits a 1.3 dB loss. Each RF tap 1404-1410 exhibits a 1.7 dbloss from its input port to its pass-through output port. Accordingly,in this example, the master test system 752 includes one diplexer 1402and two RF taps 1404, 1406, and exhibits a 4.7 dB loss. If the mastertest system 752 receives a 45 dB signal, it will provide a 40.3 dBsignal to the first slave test system 754(1). Each slave system 754includes two RF taps 1408, 1410, and thus exhibits a 3.4 dB loss acrossit.

To account for this signal loss, an amplifier 774 may be positionedbetween each rack and/or between groups of racks. In the presentexample, a 15 dB amplifier 774 is positioned between the third andfourth rack to account for the 14.9 dB loss across the master rack (4.7dB) and the three slave racks (3×3.4 dB=10.2 dB).

As shown, the fourth slave test system 754(4) receives the 45.1 dB testsignal. In the example, there is another 15 dB amplifier 774 positionedbetween the eighth and ninth slave test system 54. Accordingly, the fiveslave systems exhibit a 17 dB loss (5×3.4 dB=17 dB), and the ninth slavetest system 754(9) receives a 43.1 dB signal.

Although the amplifiers 774 are being shown as both being 15 dBamplifiers, different sized amplifiers may be used. They need not be thesame. The amplifiers may be selected/configured based on the signaldegradation, and may account for additional losses, such as line and/orother component losses.

FIG. 15 illustrates a high-level system architecture of a testingnetwork 1500 for cable modem tests using a master test system 752 and aplurality of slave test systems 754, according to some implementations.The testing network 1500 may include a firewall 1502, a switch 1504, themaster test system 752, and a plurality of slave test systems (shown asa first slave test system 754(1), a second slave test system 754(2), anda ninth slave test system 754(9)). The desktop switch 1504 may beconfigured to couple the firewall 1502 to the master test system 752 andthe slave test systems 754. The master test system 752 may include theCMTS 1025, the provisioning/SIP server 1020, the master resource server1012, the CMS server 1022, the DOCSIS/WAN server 1024, and the slavetest system control server 1014. Each slave test system 754 may includethe slave resource server 1212 and the slave test management server1216.

FIG. 16 illustrates a flowchart of a method 1600 for testing a cablemodem in one or more slots using a master test system and a plurality ofslave test systems, according to some implementations. The method 1600may be executed using the structures in the testing network 700A, shownin FIG. 7A and discussed herein.

At an operation 1602, a first plurality of devices under test may beplaced in a first plurality of test slots. The first plurality of testslots may be configured to protect the first plurality of devices undertest from first electromagnetic interference associated with the firstplurality of devices under test. In some implementations, a tester mayplace a first plurality of DUTs in the master test slots 756. The firstplurality of DUTs may reside in Faraday cages and/or othermagnetically/electromagnetically shielded structures corresponding tospecific test of the master test slots 756. One or more of the firstplurality of DUTs may comprise cable modems, embedded MultimediaTerminal Adapters (eMTAs), etc.

At an operation 1604, a second plurality of devices under test may beplaced in a second plurality of test slots, the second plurality of testslots being configured to protect the second plurality of devices undertest from second electromagnetic interference associated with the secondplurality of devices under test. In some implementations, a tester mayplace a second plurality of DUTs in the slave test slots 758 (e.g., thefirst slave test slots 758(1)). The second plurality of DUTs may residein Faraday cages and/or other magnetically/electromagnetically shieldedstructures corresponding to specific test of the slave test slots 758.One or more of the second plurality of DUTs may comprise cable modems,embedded Multimedia Terminal Adapters (eMTAs), etc.

At an operation 1606, a first device interface may be used to couple thefirst plurality of devices under test to a master test system over afirst coupling, the first device interface being configured toaccommodate first signal degradation due to the first coupling. A testermay couple the input cable(s) 762 to the DUTs in the master test slots756 and the master test system 752. The tester may place themaster-to-device interface 770 within the signal path of the DUTs in themaster test slots 756 and the master test system 752. Themaster-to-device interface 770 may, as discussed herein, reduce effectsof attenuation due to the configuration of one or more of the mastertest system 752, the input cable(s) 762, and the DUTs in the master testslots 756.

At an operation 1608, a second device interface may be used to couplethe second plurality of devices under test to a first slave test systemover a second coupling, the second device interface being configured toaccommodate second signal degradation due to the second coupling. Atester may couple the input cable(s) 764 to the DUTs in the slave testslots 785 and the slave test system 754. The tester may place theslave-to-device interface 772 within the signal path of the DUTs in theslave test slots 758 and the slave test system 754. The slave-to-deviceinterface 772 may reduce effects of attenuation due to the configurationof one or more of the slave test system 754, the input cable(s) 764, andthe DUTs in the slave test slots 758.

At an operation 1610, the master test system may be configured toprovide first test instructions to test the first plurality of devicesunder test. In some implementations, a tester may provide instructionsto the master test system 752 through the test controller 702 and/or themobile device 708 to configure the master test system 752 to provideinstructions to the DUTs in the master test slots 756. The master testsystem 752 may also be configured automatically without humanintervention, etc. The first test instructions may comprise instructionsto test the DUTs in the master test slots 756 in accordance with sharedtest protocols, resource test protocols, etc.

At an operation 1612, the master test system 752 may be configured toprovide second test instructions to test the second plurality of devicesunder test (e.g., to DUTs in the slave test slots 758). The second testinstructions may comprise instructions to test the DUTs in the slavetest slots 758 in accordance with shared test protocols, etc.

At an operation 1614, the first slave test system may be configured toprovide the second test instructions to test the second plurality ofdevices under test. In some implementations, the slave test systems 754may be configured (though the test controller 702, the mobile device708, automatically, etc.) to provide the third test instructions to testthe DUTs in the slave test slots 758. The third test instructions maycomprise instructions to test the DUTs in the slave test slots 758 inaccordance with resource test protocols, etc.

FIG. 17 illustrates a flowchart of a method 1700A for testing a cablemodem in one or more slots using a master test system 752 and aplurality of slave test systems 754, according to some implementations.The method 1700A may be executed using the structures in the master testsystem 752 and/or the slave test systems 754, shown in FIG. 7A, FIG. 10,FIG. 11, FIG. 12, and/or FIG. 13, and discussed further herein.

At an operation 1702, first identifiers of a first plurality of devicesunder test coupled to a master test system 752 may be gathered. Invarious implementations, the master test management server 1016 may beconfigured to gather first identifiers of DUTs in the master test slots756. The first identifiers may correspond to any convenient way toidentify the DUTs in the master test slots 756, including, but notlimited to MAC address identifiers. In some implementations, the firstidentifiers correspond to values obtained from bar codes or other codesread in by the input device 712.

At an operation 1704, second identifiers of a second plurality ofdevices under test coupled to a first slave test system coupled to themaster test system may be gathered. In various implementations, themaster test management server 1016 may be configured to gather secondidentifiers of DUTs in the slave test slots 758. The second identifiersmay correspond to any convenient way to identify the DUTs in the slavetest slots 758, including, but not limited to MAC address identifiers.In some implementations, the second identifiers correspond to valuesobtained from bar codes or other codes read in by the input device 712.

At an operation 1706, shared test protocols that provide a basis to testcompliance of one or more shared functional parameters shared by thefirst plurality of devices under test and the second plurality ofdevices under test may be identified. The shared test protocol server(s)1010 may identify shared test protocols that provide a basis to testcompliance of one or more shared functional parameters shared by thefirst plurality of devices under test and the second plurality ofdevices under test. In various implementations, the provisioning/SIPserver 1020, the CMS server 1022, the DOCSIS/WAN server 1024, and/or theCMTS 1025 may identify corresponding test protocols that provide a basisto test compliance of one or more shared functional parameters shared bythe first plurality of devices under test and the second plurality ofdevices under test.

At an operation 1708, first resource test protocols that provide a basisto test compliance of one or more resource parameters of the firstplurality of devices under test may be identified. The master resourceserver 1012 may identify first resource test protocols that provide abasis to test compliance of one or more resource parameters of the DUTsin the master test slots 756.

At an operation 1710, second resource test protocols that provide abasis to test compliance of one or more resource parameters of thesecond plurality of devices under test may be identified. The masterresource server 1012 may identify second resource test protocols thatprovide a basis to test compliance of one or more resource parameters ofthe DUTs in the slave test slots 758.

At an operation 1712, a group of shared probes may be configured at themaster test system to implement the shared test protocols on the firstplurality of devices under test and the second plurality of devicesunder test. In some implementations, the master probe container 1018 mayconfigure a group of shared probes to implement the shared testprotocols on the DUTs in the master test slots 756 and/or the DUTs inthe slave test slots 758. The master probe container 1018 may identifyone or more test probe containers that correspond to the group of sharedprobes, where the one or more test probe containers comprise virtualrepresentations of the group of shared probes.

At an operation 1714, a first group of resource probes may be configuredat the master test system to implement the first resource test protocolson the first plurality of devices under test. In some implementations,the master probe container 1018 may configure a first group of resourceprobes to implement the first resource test protocols on the DUTs in themaster test slots 756. The master probe container 1018 may identify oneor more test probes that correspond to the first group of resourceprobes, where the one or more test probes comprise virtualrepresentations of the first group of resource probes.

At an operation 1716, the first slave test system may be providedinstructions to configure a second group of resource probes at the firstslave test system to implement the second resource test protocols on thesecond plurality of devices under test. More particularly, the slavetest system control server 1014 may provide instructions to the slavetest system(s) 754 to configure a second group of resource probes at theslave test system(s) 754 to implement the second resource test protocolson the DUTs in the slave test slots 758.

FIG. 18 depicts an example of a digital device 1800, according to someimplementations. The digital device 1800 comprises a processor 1805, amemory system 1810, a storage system 1815, a communication networkinterface 1820, an I/O interface 1825, a display interface 1830, and abus 1835. The bus 1835 may be communicatively coupled to the processor1805, the memory system 1810, the storage system 1815, the communicationnetwork interface 1820, the I/O interface 1825, and the displayinterface 1830.

In some implementations, the processor 1805 comprises circuitry or anyprocessor capable of processing the executable instructions. The memorysystem 1810 comprises any memory configured to store data. Some examplesof the memory system 1810 are storage devices, such as RAM or ROM. Thememory system 1810 may comprise the RAM cache. In variousimplementations, data is stored within the memory system 1810. The datawithin the memory system 1810 may be cleared or ultimately transferredto the storage system 1815.

The storage system 1815 comprises any storage configured to retrieve andstore data. Some examples of the storage system 1815 are flash drives,hard drives, optical drives, and/or magnetic tape. In someimplementations, the digital device 1800 includes a memory system 1810in the form of RAM and a storage system 1815 in the form of flash data.Both the memory system 1810 and the storage system 1815 comprisecomputer readable media which may store instructions or programs thatare executable by a computer processor including the processor 1805.

The communication network interface (com. network interface) 1820 may becoupled to a data network. The communication network interface 1820 maysupport communication over an Ethernet connection, a serial connection,a parallel connection, or an ATA connection, for example. Thecommunication network interface 1820 may also support wirelesscommunication (e.g., 802.1a/b/g/n, WiMAX, LTE, 3G, 2G). It will beapparent to those skilled in the art that the communication networkinterface 1820 may support many wired and wireless standards.

The I/O interface 1825 may comprise any device that receives input fromthe user and output data. The display interface 1830 may comprise anydevice that may be configured to output graphics and data to a display.In one example, the display interface 1830 is a graphics adapter.

It will be appreciated by those skilled in the art that the hardwareelements of the digital device 1800 are not limited to those depicted inFIG. 18. A digital device 1800 may comprise more or less hardwareelements than those depicted. Further, hardware elements may sharefunctionality and still be within various implementations describedherein. In one example, encoding and/or decoding may be performed by theprocessor 1805 and/or a co-processor located on a GPU.

Some portions of the detailed description are presented in terms ofalgorithms and symbolic representations of operations on data bitswithin a computer memory. These algorithmic descriptions andrepresentations are the means used by those skilled in the dataprocessing arts to most effectively convey the substance of their workto others skilled in the art. An algorithm is here, and generally,conceived to be a self-consistent sequence of operations leading to adesired result. The operations are those requiring physicalmanipulations of physical quantities. Usually, though not necessarily,these quantities take the form of electrical or magnetic signals capableof being stored, transferred, combined, compared, and otherwisemanipulated. It has proven convenient at times, principally for reasonsof common usage, to refer to these signals as bits, values, elements,symbols, characters, terms, numbers, or the like.

It should be borne in mind, however, that all of these and similar termsare to be associated with the appropriate physical quantities and aremerely convenient labels applied to these quantities. Unlessspecifically stated otherwise as apparent from the following discussion,it is appreciated that throughout the description, discussions utilizingterms such as “processing” or “computing” or “calculating” or“determining” or “displaying” or the like, refer to the action andprocesses of a computer system, or similar electronic computing device,that manipulates and transforms data represented as physical(electronic) quantities within the computer system's registers andmemories into other data similarly represented as physical quantitieswithin the computer system memories or registers or other suchinformation storage, transmission or display devices.

Techniques described in this paper relate to apparatus for performingthe operations. The apparatus can be specially constructed for therequired purposes, or it can comprise a general purpose computerselectively activated or reconfigured by a computer program stored inthe computer. Such a computer program can be stored in a computerreadable storage medium, such as, but is not limited to, read-onlymemories (ROMs), random access memories (RAMS), EPROMs, EEPROMs,magnetic or optical cards, any type of disk including floppy disks,optical disks, CD-ROMs, and magnetic-optical disks, or any type of mediasuitable for storing electronic instructions, and each coupled to acomputer system bus.

For purposes of explanation, numerous specific details are set forth inorder to provide a thorough understanding of the description. It will beapparent, however, to one skilled in the art that embodiments of thedisclosure can be practiced without these specific details. In someinstances, modules, structures, processes, features, and devices areshown in block diagram form in order to avoid obscuring the description.In other instances, functional block diagrams and flow diagrams areshown to represent data and logic flows. The components of blockdiagrams and flow diagrams (e.g., modules, blocks, structures, devices,features, etc.) may be variously combined, separated, removed,reordered, and replaced in a manner other than as expressly describedand depicted herein.

Reference in this specification to “one embodiment”, “an embodiment”,“some implementations”, “various implementations”, “certainembodiments”, “other embodiments”, “one series of embodiments”, or thelike means that a particular feature, design, structure, orcharacteristic described in connection with the embodiment is includedin at least one embodiment of the disclosure. The appearances of, forexample, the phrase “in one embodiment” or “in an embodiment” in variousplaces in the specification are not necessarily all referring to thesame embodiment, nor are separate or alternative embodiments mutuallyexclusive of other embodiments. Moreover, whether or not there isexpress reference to an “embodiment” or the like, various features aredescribed, which may be variously combined and included in someimplementations, but also variously omitted in other embodiments.Similarly, various features are described that may be preferences orrequirements for some implementations, but not other embodiments.

The language used herein has been principally selected for readabilityand instructional purposes, and it may not have been selected todelineate or circumscribe the inventive subject matter. It is thereforeintended that the scope be limited not by this detailed description, butrather by any claims that issue on an application based hereon.Accordingly, the disclosure of the embodiments is intended to beillustrative, but not limiting, of the scope, which is set forth in theclaims recited herein.

1. A system comprising: a master test system configured to provide:first test instructions to test a first plurality of devices under test,the first plurality of devices under test being housed in a firstplurality of test slots, the first plurality of test slots beingconfigured to protect the first plurality of devices under test fromfirst electromagnetic interference associated with the first pluralityof devices under test; and second test instructions to test a secondplurality of devices under test, the second plurality of devices undertest being housed in a second plurality of test slots, the secondplurality of test slots being configured to protect the second pluralityof devices under test from second electromagnetic interferenceassociated with the second plurality of devices under test; a firstdevice interface configured to couple the master test system to thefirst plurality of devices under test over a first coupling, the firstdevice interface being configured to accommodate first signaldegradation due to the first coupling; a first slave test system coupledto the master test system, the first slave test system configured toprovide the second test instructions to the second plurality of devicesunder test; and a second device interface configured to couple the firstslave test system to the second plurality of devices under test over asecond coupling, the second device interface being configured toaccommodate second signal degradation due to the second coupling.
 2. Thesystem of claim 1, wherein the first signal degradation comprises afirst attenuation due to the first coupling, or the second signaldegradation comprises a second attenuation due to the second coupling.3. The system of claim 1, wherein the first plurality of devices undertest comprises a first plurality of cable modems or a first plurality ofEmbedded Multimedia Terminal Adapters (eMTAs), or the second pluralityof devices under test comprises a second plurality of cable modems or asecond plurality of Embedded Multimedia Terminal Adapters (eMTAs). 4.The system of claim 1, wherein the first device interface comprises afirst attenuator configured to accommodate a first attenuation due tothe first coupling.
 5. The system of claim 1, wherein the second deviceinterface comprises a second attenuator configured to accommodate asecond attenuation due to the second coupling.
 6. The system of claim 1,wherein the first plurality of test slots or the second plurality oftest slots comprise Faraday cages configured to magnetically shielditems housed therein.
 7. The system of claim 1, wherein the firstplurality of test slots or the second plurality of test slots areincorporated into a test rack configured to facilitate testing of itemslocated thereon.
 8. The system of claim 1, wherein: the master testsystem is configured to provide third test instructions to test a thirdplurality of devices under test, the third plurality of devices undertest being housed in a third plurality of test slots, the thirdplurality of test slots being configured to protect the third pluralityof devices under test from third electromagnetic interference associatedwith the third plurality of devices under test; and the system furthercomprises: a second slave test system, the second slave test systemconfigured to provide the third test instructions to the third pluralityof devices under test; and a third device interface configured to couplethe second slave test system to the third plurality of devices undertest over a third coupling, the third device interface being configuredto accommodate third signal degradation due to the third coupling. 9.The system of claim 8, wherein the first slave test system and thesecond slave test system are coupled to one another using a coaxial lineand an amplifier, the amplifier being configured to accommodate signaldegradation due to the coaxial line.
 10. The system of claim 8, whereinthe master test system and the second slave test system are coupled toone another using a coaxial line and an amplifier, the amplifier beingconfigured to accommodate signal degradation due to the coaxial line.11. The system of claim 1, further comprising a test controller coupledto the master test system, the test controller being configured toprovide the first test instructions and the second test instructions tothe master test system.
 12. The system of claim 11, further comprisingan input device coupled to the test controller, the input device beingconfigured to receive identifiers of the first plurality of devicesunder test and the second plurality of devices under test.
 13. Thesystem of claim 12, wherein the test controller and the input device areincorporated into one or more of a mobile phone, a tablet computingdevice, a laptop computer, and a desktop computer.
 14. A methodcomprising: placing a first plurality of devices under test in a firstplurality of test slots, the first plurality of test slots beingconfigured to protect the first plurality of devices under test fromfirst electromagnetic interference associated with the first pluralityof devices under test; placing a second plurality of devices under testin a second plurality of test slots, the second plurality of test slotsbeing configured to protect the second plurality of devices under testfrom second electromagnetic interference associated with the secondplurality of devices under test; using a first device interface tocouple the first plurality of devices under test to a master test systemover a first coupling, the first device interface being configured toaccommodate first signal degradation due to the first coupling; using asecond device interface to couple the second plurality of devices undertest to a first slave test system over a second coupling, the seconddevice interface being configured to accommodate second signaldegradation due to the second coupling; configuring the master testsystem to provide first test instructions to test the first plurality ofdevices under test; configuring the master test system to provide secondtest instructions to test the second plurality of devices under test;and configuring the first slave test system to provide third testinstructions to test the second plurality of devices under test.
 15. Themethod of claim 14, wherein the first signal degradation comprises afirst attenuation due to the first coupling, or the second signaldegradation comprises a second attenuation due to the second coupling.16. The method of claim 14, wherein the first plurality of devices undertest comprises a first plurality of cable modems or a first plurality ofEmbedded Multimedia Terminal Adapters (eMTAs), or the second pluralityof devices under test comprises a second plurality of cable modems or asecond plurality of Embedded Multimedia Terminal Adapters (eMTAs). 17.The method of claim 14, wherein the first device interface comprises afirst attenuator configured to accommodate a first attenuation due tothe first coupling.
 18. The method of claim 14, wherein the seconddevice interface comprises a second attenuator configured to accommodatea second attenuation due to the second coupling.
 19. The method of claim14, wherein the first plurality of test slots or the second plurality oftest slots comprise Faraday cages configured to magnetically shielditems housed therein.
 20. The method of claim 14, wherein the firstplurality of test slots or the second plurality of test slots areincorporated into a test rack configured to facilitate testing of itemslocated thereon.
 21. The method of claim 14, further comprising: using athird device interface to couple a second slave test system to a thirdplurality of devices under test over a third coupling, the third deviceinterface being configured to accommodate third signal degradation dueto the third coupling, and the third plurality of devices under testbeing housed in a third plurality of test slots, the third plurality oftest slots being configured to protect the third plurality of devicesunder test from third electromagnetic interference associated with thethird plurality of devices under test; and providing fourth testinstructions to test the third plurality of devices under test.
 22. Themethod of claim 21, further comprising: coupling the second slave testsystem to the first slave test system or to the master test system. 23.The method of claim 14, further comprising: coupling a second slave testsystem to the master test system; using a third device interface tocouple the second slave test system to a third plurality of devicesunder test over a third coupling, the third device interface beingconfigured to accommodate third signal degradation due to the thirdcoupling, and the third plurality of devices under test being housed ina third plurality of test slots, the third plurality of test slots beingconfigured to protect the third plurality of devices under test fromthird electromagnetic interference associated with the third pluralityof devices under test; and providing fourth test instructions to testthe third plurality of devices under test.
 24. The method of claim 14,further comprising providing, using a test controller coupled to themaster test system, the first test instructions and the second testinstructions to the master test system.
 25. The method of claim 24,further comprising receiving, using an input device coupled to the testcontroller, identifiers of the first plurality of devices under test andthe second plurality of devices under test.
 26. The method of claim 25,wherein the test controller and the input device are incorporated intoone or more of a mobile phone, a tablet computing device, a laptopcomputer, and a desktop computer.